ENBIS: European Network for Business and Industrial Statistics
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The Wiley Encyclopedia of Statistics in Quality and Reliability
Author: Winfried Theis, Last updated 1-Jul-08 13:28
In December 2007, Wiley published the printed version of the Encyclopedia of Statistics in Quality and Reliability (link to publication). The on line version was launched in April 2008 (http://mrw.interscience.wiley.com/emrw/9780470061572/home/).
The encyclopedia has been described by reviewers as "The major reference work for industrial statistics in academia, industry and services in the 21st century." Among it's editors and contributors one can find many ENBIS members.
Specifically, Fabrizio Ruggeri and Ron Kenett are editors in chief of the encyclopedia, Jeroen de Mast section editor of the section on Definitions and Basic Statistics, David Steinberg section editor of the section on Design of Experiments and Robust Design, Tony Greenfield section editor of the section on Health, Safety and Environmental Applications and Rainer Goeb section editor of the section on Sampling.
In the list contributors to the encyclopedia 4 volumes, 2173 pages and 434 entries on can find active ENBIS members such as Irad Ben-Gal, Bo Bergman, Alessandro di Bucchianico, Elart von Collani, Shirley Coleman, Oystein Evandt, Peter Goos, Joachim Kunert, Alberto Luceno,Christopher McCollin, Henrik Meelgaard, Irena Ograjenek, Daniele Romano, Poul Thyregod, Murat Testik, Xavier Tort-Martorell, John Tyssedal, Kerstin Vannman and Christian Weiss.
The encyclopedia covers the following topics:
- Management of Quality and Business Statistics
- Process Capability and Measurement Systems Analysis
- Design of Experiments and Robust Design
- Sampling
- Process Control
- Reliability: Life Distribution Modeling and Accelerated Testing
- Reliability: Life Cycle and Warranty Cost Prediction
- System Reliability
- Health, Safety and Environmental Applications
- Statistical and Stochastic Modeling
- Computationally Intensive Methods and Simulation
- Basic Statistics for Quality and Reliability
The topics covered include application examples, state of the art methodologies as well as introductory material. Sample articles on Causality by Oystein Evandt, Bayesian Networks by Irad Ben-Gal and Sampling in Pharmaceutical and Chemical Industries by Henrik Melgaard are available for free at http://mrw.interscience.wiley.com/emrw/0470-06157X/home/SampleContent.html.
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